Testability Designed In, Not Bolted On
DFT added late in the design cycle costs area, performance, and schedule. Quantova integrates DFT planning from the RTL phase — defining test modes, scan architecture, and memory BIST strategy before implementation begins, so there are no late-stage surprises.
Core Capabilities
Scan Insertion
Full-scan and partial-scan chain insertion with scan compression. Stuck-at and transition fault coverage targeting your test spec.
Memory BIST (Built-In Self Test)
March algorithm-based MBIST for embedded SRAMs and ROMs. Fault coverage and test time within your power and area budget.
ATPG (Automatic Test Pattern Generation)
Automatic test pattern generation with stuck-at, transition, and path-delay patterns. Pattern compression and simulation included.
JTAG Integration
IEEE 1149.1 JTAG boundary scan implementation and integration for board-level test and debug access.
What You Receive
- Scan-inserted netlist
- ATPG patterns and simulation reports
- Fault coverage report
- DFT architecture document
- MBIST controller and test plan
Tools & Platforms
Common Questions
Yes, but with constraints. Late-stage DFT insertion has area and timing implications. We assess the current state and advise on the most practical approach given your schedule.
We target the coverage specified in your test plan. Typical targets are 95-98% stuck-at fault coverage and 90%+ transition fault coverage.